发明名称 DNA CHIP AND INSPECTION APPARATUS USING SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a DNA chip for determining a number of specimens by using a conventional inspection apparatus, and to provide an inspection apparatus using the DNA chip. <P>SOLUTION: The inspection apparatus has a number of probes, and integrated circuit sections 14 (12, 13) between a probe electrode 9 connected to the probes and an electrode 10 for outputting signals from the DNA chip in the DNA chip for reacting with the specimens. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006133080(A) 申请公布日期 2006.05.25
申请号 JP20040322439 申请日期 2004.11.05
申请人 TOSHIBA CORP 发明人 MURATA ATSUSHI
分类号 G01N27/327;C12M1/00;C12M1/40;C12N15/09;G01N27/416;G01N33/53;G01N33/543;G01N37/00 主分类号 G01N27/327
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