发明名称 RESISTIVE MEMORY DEVICE AND MANUFACTURING METHOD THEREOF
摘要 <P>PROBLEM TO BE SOLVED: To provide a resistive memory device having a probe array, and to provide a manufacturing method of the same. <P>SOLUTION: A resistive memory device has a memory 10, including a first substrate 101, a second substrate 300, and a bottom electrode layer 100 and a ferroelectric layer 200 formed on the first substrate 101; a probe 20 fixed on the second substrate 300 and having a chip so as to be opposed to the ferroelectric layer 200, and also having a resistive probe 400 for recording and regenerating data to the ferroelectric layer 200; and a coupling layer 500 grasping the resistive probe 400 and fixing it on the ferroelectric layer 200. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006135326(A) 申请公布日期 2006.05.25
申请号 JP20050319041 申请日期 2005.11.02
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 HONG SEUNG-BUM;JUNG JU-HWAN;KO HYOUNG-SOO;BOKU KOSHOKU;MIN DONG-KI;KIN ONSHOKU;PARK CHUL-MIN;KIM SUNG-DONG;BAECK KYOUNG-LOCK
分类号 H01L27/10;H01L45/00;H01L49/00 主分类号 H01L27/10
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