| 发明名称 |
Test pattern compression with pattern-independent design-independent seed compression |
| 摘要 |
The present invention is directed to a logic testing architecture with an improved decompression engine that compresses the seeds of a linear test pattern generator in a manner that is independent of the test pattern set.
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| 申请公布号 |
US2006112320(A1) |
申请公布日期 |
2006.05.25 |
| 申请号 |
US20050095222 |
申请日期 |
2005.03.31 |
| 申请人 |
NEC LABORATORIES AMERICA, INC. |
发明人 |
BALAKRISHNAN KEDARNATH;WANG SEONGMOON;CHAKRADHAR SRIMAT T. |
| 分类号 |
G01R31/28;G06F11/00 |
主分类号 |
G01R31/28 |
| 代理机构 |
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