发明名称 |
Production of semiconductor elements for Bragg reflector involves growing epitaxial aluminum indium nitride layers, and changing aluminum-to-indium ratio during growth process |
摘要 |
<p>Production of semiconductor elements comprises growing epitaxial AlInN layers in connection with GaN, AlN or AlGaN layers and reducing the Al:In ratio and/or raising substrate temperature during growth of the first 1-200 nm of the layer or pre-streaming indium before the Al process to grow the AlInN layer. An independent claim is also included for a semiconductor element formed as above.</p> |
申请公布号 |
DE102004055636(A1) |
申请公布日期 |
2006.05.24 |
申请号 |
DE20041055636 |
申请日期 |
2004.11.12 |
申请人 |
AZZURRO SEMICONDUCTORS AG |
发明人 |
DADGAR, ARMIN;KROST, ALOIS |
分类号 |
H01L21/205;H01L21/338;H01L33/00 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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