发明名称 |
Measuring the wall thickness of melting devices filled with a glass melt and having a wall with a layer of refractory material comprises irradiating radar waves into the wall on the outer side and further processing |
摘要 |
<p>Method for measuring the wall thickness of melting devices filled with a glass melt and having a wall with a layer of refractory material comprises irradiating radar waves into the wall on the outer side, measuring the radar waves reflected at dielectric transitions and measuring the wall thickness from the reflections corresponding to the running time of the wall inner side-glass melt transition.</p> |
申请公布号 |
DE102004056393(A1) |
申请公布日期 |
2006.05.24 |
申请号 |
DE20041056393 |
申请日期 |
2004.11.23 |
申请人 |
SCHOTT AG |
发明人 |
WILKE, THORSTEN;EICHHORN, UWE;DAEUBNER, MANFRED |
分类号 |
G01B15/02;G01N22/00 |
主分类号 |
G01B15/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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