发明名称 Coating of copper and silver air bridge structures to improve electromigration resistance and other applications
摘要 An improved electrical interconnect for an integrated circuit and methods for providing the same are disclosed. The electrical interconnect includes an air bridge extending through a gaseous medium so as to reduce the capacitance of the interconnect. The air bridge is supported at a first and second end such that the air bridge is suspended above the substrate. The air bridge comprises a highly conductive material, such as silver, so as to provide the air bridge with a reduced resistivity. To inhibit gaseous medium from contaminating the air bridge, the air bridge further comprises an adherent coating interposed between the air bridge and the gaseous medium. A method of forming the electrical interconnect is also disclosed, wherein, prior to forming the adherent coating, the conductive material is processed so as to form fewer grain boundaries, which enhances the electrical properties of the air bridge.
申请公布号 US7049219(B1) 申请公布日期 2006.05.23
申请号 US20020291909 申请日期 2002.11.08
申请人 发明人
分类号 H01L21/4763 主分类号 H01L21/4763
代理机构 代理人
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