Conductor-pattern testing method, and electro-optical device

摘要

A conductor pattern having both elongated conductors and a dummy pattern is formed on a substrate. The dummy pattern is formed of dummy conductors. The elongated conductors are typically transparent electrodes. The dummy pattern is so configured that each of the dummy conductors are mutually set apart with a spacing as appropriate in the extending direction (top-and-bottom direction) and in the array direction (right-and-left direction) of the transparent electrodes to prevent any two inspection probes from contacting a single dummy conductor.