发明名称 |
Built-in testing methodology in flash memory |
摘要 |
An Electric Wafer Sort (EWS) flow is implemented by expanding the functions of the micro-controller embedded in a FLASH EPROM memory device and of the integrated test structures. Test routines are executed by the onboard micro-controllers (that may be reading either from an embedded ROM or from a GLOBAL CACHE provided) internally without involving any external complex or expensive test equipment to control the test program. The device architecture is transparent from a tester point of view, with a standard interface having a set of defined commands and instructions to be interpreted by the on board microcontroller and internally executed.
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申请公布号 |
US7050343(B2) |
申请公布日期 |
2006.05.23 |
申请号 |
US20040789443 |
申请日期 |
2004.02.27 |
申请人 |
STMICROELECTRONICS S.R.L. |
发明人 |
KUMAR PROMOD;TOMAIUOLO FRANCESCO;NICOSIA PIERPAOLO;DE AMBROGGI LUCA GIUSEPPE;PIPITONE FRANCESCO |
分类号 |
G11C29/00;G11C29/16 |
主分类号 |
G11C29/00 |
代理机构 |
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地址 |
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