发明名称 Semiconductor memory cell and semiconductor memory device
摘要 The semiconductor memory cell is characterized in that at least one modulation region is provided between a first gate electrode of the gate electrode configuration and the insulation region, and in that the modulation region has or is formed from a material or modulation material having electrical and/or further material properties that can be modulated in a controllable manner between at least two states in such a way that, in accordance with these states of the modulation material or of the modulation region, the channel region can be influenced electromagnetically, in particular for a given electrical potential difference between the first gate electrode and the source/drain regions.
申请公布号 US7049628(B2) 申请公布日期 2006.05.23
申请号 US20030395428 申请日期 2003.03.24
申请人 INFINEON TECHNOLOGIES AG 发明人 SCHMID GUENTER;HALIK MARCUS;KLAUK HAGEN;DEHM CHRISTINE;HANEDER THOMAS;MIKOLAJICK THOMAS
分类号 H01L35/24;G11C11/56;G11C13/02;H01L27/10;H01L29/78 主分类号 H01L35/24
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