发明名称 Silver selenide film stoichiometry and morphology control in sputter deposition
摘要 A method of sputter depositing silver selenide and controlling the stoichiometry and nodular defect formations of a sputter deposited silver-selenide film. The method includes depositing silver-selenide using a sputter deposition process at a pressure of about 0.3 mTorr to about 10 mTorr. In accordance with one aspect of the invention, an RF sputter deposition process may be used preferably at pressures of about 2 mTorr to about 3 mTorr. In accordance with another aspect of the invention, a pulse DC sputter deposition process may be used preferably at pressures of about 4 mTorr to about 5 mTorr.
申请公布号 US7049009(B2) 申请公布日期 2006.05.23
申请号 US20040012154 申请日期 2004.12.16
申请人 MICRON TECHNOLOGY, INC. 发明人 LI JIUTAO;HAMPTON KEITH;MCTEER ALLEN
分类号 B32B15/00;C23C14/00;C23C14/06;C23C14/34;C23C14/54;C30B23/02;G11C11/34;H01B1/02 主分类号 B32B15/00
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