METHOD FOR CHECKING REDUNDANT CELL OF MEMORY DEVICE USING REPAIR SIMULATION PROGRAM,申请号KR20040093119-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	METHOD FOR CHECKING REDUNDANT CELL OF MEMORY DEVICE USING REPAIR SIMULATION PROGRAM
摘要
申请公布号	KR20060053428(A)	申请公布日期	2006.05.22
申请号	KR20040093119	申请日期	2004.11.15
申请人	HYNIX SEMICONDUCTOR INC.	发明人	KIM, JIN HA
分类号	G06F12/16;G06F11/00	主分类号	G06F12/16
代理机构		代理人
主权项
地址

您可能感兴趣的专利

FACSIMILE EQUIPMENT

IMAGE PROCESSOR AND IMAGE PROCESSING METHOD

METHOD AND SYSTEM FOR MANAGING DESTINATION TELEPHONE NUMBER

METHOD FOR AUTOMATICALLY SETTING PILOT SIGNAL FREQUENCY AND DISTORTION COMPENSATION AMPLIFIER

SURFACE ACOUSTIC WAVE FILTER

MULTILAYER MAGNETORESISTANCE EFFECT FILM, MAGNETORESISTANCE EFFECT ELEMENT AND MAGNETORESISTANCE EFFECT TYPE MAGNETIC HEAD

SURFACE-MOUNTING HOLDER

TUNGSTEN MULTILAYER SUBSTANCE AND SELECTIVE DEPOSITING METHOD OF TUNGSTEN

DEVICE FOR PROCESSING WAFER BY LIGHT IRRADIATION

LASER LIGHT IRRADIATION DEVICE

TRANSMISSION CIRCUIT AND INITIALIZATION METHOD FOR THE CIRCUIT

NOISE ABSORBING ELEMENT

SMALL-SIZED ANTENNA

SEMICONDUCTOR DEVICE

MANUFACTURE OF SEMICONDUCTOR DEVICE

ELECTRONIC PART

CORE AND CHIP TYPE COIL USING THEREOF

ELECTRONIC PART