TEST DEVICE FOR ELECTRONIC PARTS,申请号KR20040093069-传众专利搜索

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发明名称	TEST DEVICE FOR ELECTRONIC PARTS
摘要
申请公布号	KR20060053388(A)	申请公布日期	2006.05.22
申请号	KR20040093069	申请日期	2004.11.15
申请人	SAMSUNG SDI CO., LTD.	发明人	YIM, SIN TAEK;JO, JONG KAP
分类号	G02F1/13	主分类号	G02F1/13
代理机构		代理人
主权项
地址

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