发明名称 SEMICONDUCTOR MEMORY AND FABRICATION METHOD FOR THE SAME
摘要 <p>A semiconductor memory includes memory cell transistors comprising a tunnel insulating film, a floating gate electrode, a first insulating film, a control gate electrode, and a first metal salicide film; low-voltage transistors comprising a first p-type source region and a first p-type drain region, a first gate insulating film, and a first gate electrode of an n conductivity type having the same dose of a first p-type impurity as with the first p-type source region; and high-voltage transistors comprising a second p-type source region and a second p-type drain region, a second gate insulating film thicker than the first gate insulating film, and a second gate electrode of an n conductivity type having the same dose of a second p-type impurity as with the second p-type source region.</p>
申请公布号 KR20060052005(A) 申请公布日期 2006.05.19
申请号 KR20050092983 申请日期 2005.10.04
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 ENDO MASATO
分类号 H01L29/78;H01L27/115 主分类号 H01L29/78
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