发明名称 NONVOLATILE MEMORY DEVICE
摘要 <p>A nonvolatile memory device includes: a semiconductor layer of a first conductivity type in which a first region, a second region, and a third region are partitioned by an isolation insulating layer; a semiconductor section of a second conductivity type provided in the first region and functioning as a control gate; a semiconductor section of the first conductivity type provided in the second region; a semiconductor section of the second conductivity type provided in the third region; an insulating layer provided on the semiconductor layer in the first to third regions; a floating gate electrode provided on the insulating layer across the first to third regions; impurity regions of the first conductivity type provided on each side of the floating gate electrode in the first region; impurity regions of the second conductivity type provided on each side of the floating gate electrode in the second region and functioning as either a source region or a drain region; and impurity regions of the first conductivity type provided on each side of the floating gate electrode in the third region and functioning as either a source region or a drain region.</p>
申请公布号 KR20060049592(A) 申请公布日期 2006.05.19
申请号 KR20050050883 申请日期 2005.06.14
申请人 SEIKO EPSON CORPORATION 发明人 MAEMURA KIMIHIRO;KODAIRA SATORU;KOBAYASHI HITOSHI
分类号 H01L21/8247;H01L27/115;G11C16/04;H01L21/28;H01L29/423;H01L29/76;H01L29/788;H01L29/792 主分类号 H01L21/8247
代理机构 代理人
主权项
地址
您可能感兴趣的专利