| 摘要 |
PROBLEM TO BE SOLVED: To provide an inexpensive white flaw tester having a simple structure for solid state imaging devices which surely detects a white flaw and blinking white flaw. SOLUTION: The white flaw tester 20 inspects a white flaw even in a condition that an electric signal level is unstably vared when inspecting the white flaw in a solid state imaging device from the level of video signals obtained by taking images using the imaging device. The tester has: a level setting unit 16 for setting a reference level for determining the white flaw; a determining signal generator 15 for converting the reference level to a DC voltage signal; a comparator circuit 13 for comparing the DC voltage signal with the video signal to select and output the video signal, if the video signal is greater than the DC voltage signal, or the DC voltage signal, if smaller than the DC voltage signal; and a determining attenuation circuit 14 for outputting the video signal outputted from the circuit 13, or the DC voltage signal minus the DC voltage signal where the reference level is converted. COPYRIGHT: (C)2006,JPO&NCIPI |
