发明名称 |
VERFAHREN UND VORRICHTUNG ZUR MIKROTESTDURCHFÜHRUNG |
摘要 |
<p>A system for analyzing a plurality of samples, the system comprising:
a. a platen having two substantially parallel planar surfaces and a plurality of through-holes having apertures and walls;
b. a source of optical radiation for illuminating at least one through-hole along an optical axis: and
c. an optical arrangement for analyzing light emanating from the at least one through-hole.</p> |
申请公布号 |
DE69930726(D1) |
申请公布日期 |
2006.05.18 |
申请号 |
DE1999630726 |
申请日期 |
1999.01.05 |
申请人 |
MASSACHUSETTS INSTITUTE OF TECHNOLOGY, CAMBRIDGE |
发明人 |
HUNTER, W. |
分类号 |
B01L3/00;G01N33/483;B01F13/00;B01J19/00;C40B60/14;C40B70/00;G01N21/01;G01N21/03;G01N35/00;G01N37/00 |
主分类号 |
B01L3/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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