发明名称 Optical method of examining reliefs on a structure
摘要 A method for studying a surface provided with relief features, wherein a measurement spectrum is taken and then compared with test spectra representative of arbitrary structures that are adjusted stepwise. A correlation over representative points of the spectra is selected while optimizing the determination by a hierarchized adjustment of the parameters.
申请公布号 US2006103855(A1) 申请公布日期 2006.05.18
申请号 US20050534534 申请日期 2005.05.12
申请人 COMMISSARIAT A L'ENERGIE ATOMIQUE 发明人 HAZART JEROME
分类号 G01B11/14;G01B11/06;G01B11/24 主分类号 G01B11/14
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