发明名称 LITHOGRAPHY APPARATUS, CONTROL SYSTEM FOR CONTROLLING LITHOGRAPHY APPARATUS, AND METHOD FOR MANUFACTURING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a lithography apparatus, a control system for controlling the lithography apparatus, a method for controlling the lithography apparatus, a substrate handler, a method for handling a plurality of substrates, a substrate-handling apparatus, and a method for manufacturing devices. <P>SOLUTION: The lithography apparatus includes a substrate table constructed, configured, and arranged so as to hold a plurality of substrates at each of a plurality of positions, where exposures can be made on the substrate, and a projection system constructed, configured, and arranged so as to project pattern-formed radiation beams onto the target portions of the plurality of substrates at positions where exposures can be made. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006128698(A) 申请公布日期 2006.05.18
申请号 JP20050314731 申请日期 2005.10.28
申请人 ASML NETHERLANDS BV 发明人 OCKWELL DAVID C
分类号 H01L21/027;G03F7/20;H01L21/677;H01L21/68 主分类号 H01L21/027
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