发明名称 INTERNAL FLAW INSPECTION METHOD AND INTERNAL FLAW INSPECTION DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To perform inspection of higher precision with respect to internal flaw inspection due to space discrete data such as X-ray CT data. <P>SOLUTION: This internal flaw inspection method is constituted so as to inspect the internal flaw of a target on the basis of the space discrete data for describing the spatial shape or structure of the target by a space discrete element and includes a step for extracting the internal flaw from the space discrete data 1 by an internal flaw extracting means 2, a step for collecting the element contained in the vicinal range set to the periphery of the extracted internal flaw in a predetermined expanse from the space discrete data as a related element by a related element collecting means 3, and a step for measuring the characteristic quantity such as the side or center-of-gravity position of the internal flaw on the basis of the related element collected by the related element collecting means by a characteristic quantity measuring means 4. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006125960(A) 申请公布日期 2006.05.18
申请号 JP20040313483 申请日期 2004.10.28
申请人 HITACHI LTD 发明人 NUMATA SHOHEI;TAKAGI TARO;SADAOKA NORIYUKI
分类号 G01N23/18;G01N23/04 主分类号 G01N23/18
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