| 摘要 |
PROBLEM TO BE SOLVED: To provide a simpler and highly-accurate PL quantum yield measurement method on a light emitting material and its device with measurement time shortened and measurement accuracy enhanced by using an integrating sphere, and with a calibration method used with uncertain assumption excluded therefrom in absolute sensitivity calibration on the whole of a measuring instrument. SOLUTION: This device is equipped with: the integrating sphere 5 equipped with ports 1P1 to 4P4, a baffle 7, and an attachment 6; an excitation light source 1; an emission spectrum detection part 8; optical power meters 9a and 9b for detecting transmitted light and reflected light from a specimen 3 concurring with excitation light illumination; and a computer 10 for control. A measurement specimen 3 made of an organic EL material thin-film is placed substantially at a middle position of the integrating sphere 5 by using the attachment 6. The computer 10 is connected to respective measuring instruments, that is, a photo-detector 8b and the respective power meters 9a and 9b, and is equipped with the functions of controlling the setting of these respective measuring instruments while arithmetically analyzing measurement data obtained by the respective measuring instruments. COPYRIGHT: (C)2006,JPO&NCIPI
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