发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a semiconductor device in which connection reliability is enhanced by enhancing connection strength of a semiconductor chip and wiring while lowering the resistance, and to provide its manufacturing method. <P>SOLUTION: The semiconductor device comprises a semiconductor chip 2 and wiring 6 for connection with the terminal 4 of the semiconductor chip 2. In the semiconductor chip 2, uppermost layer 4c of the terminal 4 is composed of any one kind of gold, silver, copper, tin or indium, the wiring 6 is formed of sintered body of fine metal particles composed of any one kind of gold, silver or copper, and at least a part of joint between the wiring 6 and the terminal 4 is grown epitaxially. <P>COPYRIGHT: (C)2006,JPO&NCIPI</p>
申请公布号 JP2006128337(A) 申请公布日期 2006.05.18
申请号 JP20040313406 申请日期 2004.10.28
申请人 SEIKO EPSON CORP 发明人 ITO WATARU;HAGIO YOSHITOMO;KUROSAWA HIROFUMI;YAMADA MASAHIRO
分类号 H01L21/60 主分类号 H01L21/60
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