METHOD FORMING OXIDE SITE FOR MEASURING A THICKNESS OF LAYER,申请号KR20040092378-传众专利搜索

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发明名称	METHOD FORMING OXIDE SITE FOR MEASURING A THICKNESS OF LAYER
摘要
申请公布号	KR20060046876(A)	申请公布日期	2006.05.18
申请号	KR20040092378	申请日期	2004.11.12
申请人	SAMSUNG ELECTRONICS CO., LTD.	发明人	PEAK, JONG SUN;LEE, SANG KIL;LEE, BYUNG AM;PARK, SANG YEOL;LEE, JIN WOO
分类号	H01L21/66	主分类号	H01L21/66
代理机构		代理人
主权项
地址

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