发明名称 FLASH EEPROM MEMORY
摘要 PROBLEM TO BE SOLVED: To provide a read-only memory which can be electrically deleted and which is electrically programmable. SOLUTION: A flash EEPROM memory cell comprises a channel region, a source region 238 of one side of the channel region, a drain region 240 of the other side, a floating gate structure 242 having a control gate portion 246 extending over the first portion of the channel region and a tunnel diode portion 244 extending over the second portion of the channel region, a tunnel oxide layer 247 arranged between the tunnel diode portion 244 and the channel region, a gate oxide layer arranged between the control gate portion 246 and the channel region, and a first portion which is arranged extending over the floating gate structure 242 and is separated by a layer of oxidation between levels. The second portion 252 extends over the portion of the channel region of the controlling gate structure 250 forms a pass transistor in series in the cell. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006128707(A) 申请公布日期 2006.05.18
申请号 JP20050330231 申请日期 2005.11.15
申请人 TEXAS INSTR INC <TI> 发明人 D'ARRIGO IANO;FALESSI GEORGES;SMAYLING MICHAEL C;MAROTTA GIULIO G;SANTIN GIOVANNI;BHAT MOUSUMI
分类号 G11C17/00;H01L21/8247;G11C16/04;G11C16/08;H01L27/115;H01L29/788;H01L29/792 主分类号 G11C17/00
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