发明名称 SUBSTRATE INSPECTION APPARATUS
摘要 <p><P>PROBLEM TO BE SOLVED: To inspect even a part in which illumination light is shielded by a positioning member without any problems. <P>SOLUTION: A tip surface 352 of a press nib 35 for positioning both the end sections of a substrate is formed in a specular surface, and is inclined by an angle ofδto the vertical direction. The illumination light from a point A required for detecting the inclination angle of a fillet 41 that is a part to be inspected is shielded by the press nib 35. However, by adjusting the inclination angleδ, it can be set that the illumination light from a point B that opposes the point A is subjected to specular surface reflection by the tip surface 352 of the press nib 35 and the reflection light is applied to the fillet 41 from the same direction as light from the point A. <P>COPYRIGHT: (C)2006,JPO&NCIPI</p>
申请公布号 JP2006125870(A) 申请公布日期 2006.05.18
申请号 JP20040311042 申请日期 2004.10.26
申请人 OMRON CORP 发明人 NAMIKATA HIROSHI;SHIMIZU KATSUNORI
分类号 G01N21/956 主分类号 G01N21/956
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