发明名称 HIGH VOLTAGE TRANSISTOR AND METHODS OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a high voltage transistor having a high breakdown voltage and to provide a method of manufacturing the same. SOLUTION: In a high voltage transistor having a high breakdown voltage and a method of manufacturing the transistor, there are formed a first insulation film pattern, which is a predetermined oxidized site in a semiconductor substrate and a second insulation film pattern, which surrounds at least partially the first insulation film pattern. A gate electrode is formed through vapor deposition of a conductive material on the substrate such that a first end portion is disposed on the first insulation film pattern and the second end portion is disposed on the second insulation film pattern, and thereafter source/drain regions are formed by implanting impurities into prescribed sites of the substrate. Concentration of an electric field on an edge portion of the gate electrode is alleviated, whereby it becomes feasible to manufacture a transistor having a high breakdown voltage. Employing a thermally oxidized film pattern and a CVD oxidized film pattern as a gate oxide film makes it possible to improve current and ON-resistance characteristics of an MOS transistor. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006128668(A) 申请公布日期 2006.05.18
申请号 JP20050298177 申请日期 2005.10.12
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 KANG MI-HYUN;SHIN WAJO;LEE MUENG-RYUL
分类号 H01L29/78;H01L21/28;H01L29/423;H01L29/49 主分类号 H01L29/78
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