发明名称 METHOD FOR DETECTING EXTRANEOUS MATTER ON THERMAL TREATMENT PLATE, THERMAL TREATMENT DEVICE, PROGRAM, AND COMPUTER READABLE RECORDING MEDIUM CONTAINING THE PROGRAM
摘要 <p>A thermal plate is divided into a plurality of sections. An accumulated values of temperature change of each section when a substrate is placed on the thermal plate in a normal state not having an extraneous matter is collected. According to the accumulated value during normal state, a Malanobis reference space in the judgment analysis method is created. During actual thermal treatment, an accumulated value of temperature change of each section when a substrate is placed on the thermal plate is detected. According to the accumulated value during the treatment and the Mahalanobis reference space obtained in advance, the Mahalanobis distance for the accumulated value during treatment is calculated. By comparing the calculated Mahalanobis distance to a predetermined threshold value, it is judged whether the thermal plate has any extraneous matter.</p>
申请公布号 WO2006051774(A1) 申请公布日期 2006.05.18
申请号 WO2005JP20436 申请日期 2005.11.08
申请人 TOKYO ELECTRON LIMITED;OKAMURA, KOUJI;TOMITA, HIROSHI;IWANAGA, SHUJI;ARAKI, SHINICHIRO 发明人 OKAMURA, KOUJI;TOMITA, HIROSHI;IWANAGA, SHUJI;ARAKI, SHINICHIRO
分类号 H01L21/027 主分类号 H01L21/027
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