发明名称 SAMPLING CIRCUIT AND TESTER
摘要 <p>A circuit for sampling input signals comprising a pulser generating a pulse signal depending on timing at which the input signal is to be sampled, a step recovery diode outputting a sampling pulse depending on the pulse signal, a detector for detecting the value of the input signal depending on the sampling pulse, a circuit for detecting the temperature in the vicinity of the step recovery diode, and a temperature compensating section for controlling the sampling pulse outputting timing by the step recovery diode based on the temperature detected by the temperature detection circuit.</p>
申请公布号 WO2006051694(A1) 申请公布日期 2006.05.18
申请号 WO2005JP19806 申请日期 2005.10.27
申请人 ADVANTEST CORPORATION;YAMAKAWA, MASAHIRO;UMEMURA, YOSHIHARU;AWAJI, TOSHIAKI;SHIWA, SATOSHI 发明人 YAMAKAWA, MASAHIRO;UMEMURA, YOSHIHARU;AWAJI, TOSHIAKI;SHIWA, SATOSHI
分类号 H03K3/313;H03K17/00 主分类号 H03K3/313
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