发明名称 SURFACE ANALYZER FOR CONDUCTING PHASE ANALYSIS USING PHASE DIAGRAM
摘要 <P>PROBLEM TO BE SOLVED: To easily refer to a binary or ternary system of phase diagram when conducting phase analysis using a scatter diagram prepared from a two-dimensional distribution data of element concentrations in the binary or ternary system. <P>SOLUTION: This analyzer is provided with a means for reading the disclosed phase diagram in as an image file, and a means for graphing points on a line such as a concentration axis/temperature axis and a liquid phase line/solid phase line of the phase diagram read in as the image file to be assigned digitally. A marker is displayed in a corresponding concentration position on the scatter diagram when the scatter diagram and the phase diagram are displayed at the same time and when a certain value is assigned on the concentration axis of the phase diagram by a cross cursor. When the concentration position expressed by the marker on the scatter diagram is changed, a position of the cross cursor on the phase diagram corresponding thereto is also moved. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006125952(A) 申请公布日期 2006.05.18
申请号 JP20040313353 申请日期 2004.10.28
申请人 JEOL LTD 发明人 NOTOYA TOMOHITO
分类号 G01N23/223;G01N23/227;G06T1/00 主分类号 G01N23/223
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