发明名称 MANUFACTURING TEST AND PROGRAMMING SYSTEM
摘要 <p>A manufacturing test and programming system (100) is presented including providing a PCB tester (108), providing an in-system programmer (102) electrically attached to the PCB tester (108), mounting a device under test (114) having a programmable device (116) attached thereon and programming the programmable device (116) with the in-system programmer (102).</p>
申请公布号 WO2006052934(A2) 申请公布日期 2006.05.18
申请号 WO2005US40369 申请日期 2005.11.07
申请人 DATA I/O CORPORATION;BEECHER, DAVID 发明人 BEECHER, DAVID
分类号 G01R27/28 主分类号 G01R27/28
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