<p>The present subject matter relates to methodologies for providing error correc ion compensation to measurement systems. Data-dependant jitter maybe compensated b examining both short-term and long-term bit histories after applying a predetermined synthesized calibration pattern having selected characteristics to the measurement sys em. Neural networks may be provided to produce error correction signals that may be apps ied to measured data on a bit-by-bit basis to correct jitter. The synthesized calibration sequence may correspond to a base pattern having two segments; a first segment may correspond to a copy of the base pattern while the second segment may be a copy oft e base pattern with some sections inverted.</p>
