发明名称 PATTERN WRITING APPARATUS AND PATTERN WRITING METHOD
摘要 <p>An arrangement of irradiation regions (61) which correspond to micromirros of a DMD is tilted relatively to an arrangement of writing cells (620). Writing of a pattern is performed by relative movement of a irradiation region group to a writing cell group in a main scanning direction. A center-to-center distance along a sub-scanning direction between two adjacent irradiation regions (61) arranged almost in the main scanning direction is made equal to a writing pitch of writing cells (620), and a center-to-center distance along main scanning direction between them is made "a times" the writing pitch. ON/OFF control of light irradiation is performed once during relative movement of the irradiation region group by a distance equal to "n times" the writing pitch (n is an integer larger than 2). Appropriate pattern writing with high resolution at a high speed is realized where(a2+1) and n are relatively prime.</p>
申请公布号 KR20060046159(A) 申请公布日期 2006.05.17
申请号 KR20050043908 申请日期 2005.05.25
申请人 DAINIPPON SCREEN MFG. CO., LTD. 发明人 SHIROTA HIROYUKI
分类号 G03F7/20;H01L21/027 主分类号 G03F7/20
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