发明名称 SEMICONDUCTOR THIN FILM CRYSTALLIZATION DEVICE AND SEMICONDUCTOR THIN FILM CRYSTALLIZATION METHOD
摘要 <p>A first laser beam is emitted from a first laser oscillator in a pulsed manner at a high repetition frequency, and converged onto a substrate by a first intermediate optical system 2 so as to form a slit-like first beam spot. A second laser beam is emitted from a second laser beam oscillator in a pulsed manner to rise precedent to and fall subsequent to the first laser beam, and converged onto the substrate by a second intermediate optical system so as to form a second beam spot similar in configuration to the first beam spot and to contain the first beam spot. Crystallization of a semiconductor thin film on the substrate is carried out while the substrate or the first, second beam spots are moved. Thereby, the whole semiconductor thin film is formed into a crystal surface that has grown in one direction and free from ridges. Thus, the semiconductor thin film has an extremely flat surface, extremely few defects, large crystal grains and high throughput.</p>
申请公布号 KR20060046751(A) 申请公布日期 2006.05.17
申请号 KR20050067391 申请日期 2005.07.25
申请人 SHARP KABUSHIKI KAISHA 发明人 INUI TETSUYA;NAKAYAMA JUNICHIRO;TANIGUCHI YOSHIHIRO;SEKI MASANORI;TSUNASAWA HIROSHI;KASHIWAGI IKUMI
分类号 H01L21/20;H01L21/268;H01L21/324 主分类号 H01L21/20
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