发明名称 High current density particle beam system
摘要 The present invention relates to a charged particle unit for deflecting and energy-selecting charged particles of a charged particle beam 335. Thereby, a double-focusing sector unit for deflecting and focusing the charged particle beam and an energy-filter 460 forming a potential is provided, whereby charged particles of the charged particles beam are redirected at the potential-saddle depending on the energy of the charged particles.
申请公布号 EP1657736(A1) 申请公布日期 2006.05.17
申请号 EP20040027115 申请日期 2004.11.15
申请人 ICT INTEGRATED CIRCUIT TESTING GESELLSCHAFT FUER HALBLEITERPRUEFTECHNIK MBH 发明人 BRODIE, ALAN D.;CREWE, DAVID A.;FROSIEN, JUERGEN;LANIO, STEFAN;SCHOENECKER, GERALD
分类号 H01J37/244;H01J37/05;H01J37/28 主分类号 H01J37/244
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