发明名称 Amorphizing ion implant method for forming polysilicon emitter bipolar transistor
摘要 A method for fabricating a polysilicon emitter bipolar transistor employs a pair of ion implant methods. A first of the ion implant methods implants a portion of an intrinsic base region interposed between an extrinsic base region and a polysilicon emitter layer with an amorphizing non-active dopant. A second of the ion implant methods implants the polysilicon emitter layer with an active dopant to form a doped polysilicon emitter layer. The polysilicon emitter bipolar transistor is fabricated with enhanced performance.
申请公布号 US7045876(B2) 申请公布日期 2006.05.16
申请号 US20040834782 申请日期 2004.04.28
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 AN FENG-YUAN;WANG HUAN-WEN
分类号 H01L29/76;H01L21/265;H01L21/331;H01L29/08;H01L29/737 主分类号 H01L29/76
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