发明名称 Dicing and testing optical devices, including thin film filters
摘要 A technique for fabricating a plurality of thin film filters ("TFFs"), and other optical devices, from a wafer. A device or TFF wafer is affixed to a carrier having a pattern of notches formed thereon corresponding to a pattern into which the wafer is to be diced to form the TFFs. The notches are sized to allow clearance of a dicing apparatus. The wafer is diced at least partially into the notches to form the TFFs, and the TFFs may be individually optically tested with a light source aligned thereto, while they remain affixed to the carrier. The TFFs are removed from the carrier for operation, and the carrier can be re-used. To facilitate re-use, a releasable adhesive is applied to the wafer and/or the carrier, and the notches receive any excess adhesive when the wafer is being affixed to the carrier.
申请公布号 US7045370(B2) 申请公布日期 2006.05.16
申请号 US20020267423 申请日期 2002.10.09
申请人 JDS UNIPHASE CORPORATION 发明人 CRAFTS DOUGLAS E.;MORAVEC MARK;PALLADY SCOTT
分类号 H01L21/00;G02B5/20;G02B5/28 主分类号 H01L21/00
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