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发明名称
TESTER OF A DURABILITY OF A ENCODER SWITCH
摘要
申请公布号
KR20060044025(A)
申请公布日期
2006.05.16
申请号
KR20040091801
申请日期
2004.11.11
申请人
DAEWOO ELECTRONICS CORPORATION
发明人
BAE, SANG YONG
分类号
H01H21/00
主分类号
H01H21/00
代理机构
代理人
主权项
地址
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