发明名称 Semiconductor device producing method and semiconductor device producing apparatus including forming an oxide layer and changing the impedance or potential to form an oxynitride
摘要 A semiconductor device producing method using a plasma processing apparatus including a processing chamber, a substrate-supporting body which supports a substrate in the processing chamber, and a cylindrical electrode and a magnetic lines of force-forming member disposed around the processing chamber, comprises forming an oxide film on the substrate, and thereafter, by changing a high frequency impedance of the substrate-supporting body, continuously forming an oxynitride film by nitriding the oxide film by activated species of nitrogen which are activated by plasma.
申请公布号 US7045447(B2) 申请公布日期 2006.05.16
申请号 US20030396323 申请日期 2003.03.26
申请人 HITACHI KOKUSAI ELECTRIC INC. 发明人 OGAWA UNRYU;YAMAKADO NAOYA;TERASAKI TADASHI;YASHIMA SHINJI
分类号 H01L21/3205;H01L21/31;H01L21/316;H01L21/318;H01L21/469;H01L21/4763 主分类号 H01L21/3205
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