发明名称 Three dimensional high aspect ratio micromachining
摘要 Multi-level structures are formed in a semiconductor substrate by first forming a pattern of lines or structures of different widths. Width information on the pattern is decoded by processing steps into level information to form a MEMS structure. The pattern is etched to form structures having a first floor. The structures are oxidized until structures of thinner width are substantially fully oxidized. A portion of the oxide is then etched to expose the first floor. The first floor is then etched to form a second floor. The oxide is then optionally removed, leaving a multi-level structure. In one embodiment, high aspect ratio comb actuators are formed using the multi-level structure process.
申请公布号 US7045466(B2) 申请公布日期 2006.05.16
申请号 US20030607838 申请日期 2003.06.27
申请人 CORNELL RESEARCH FOUNDATION, INC. 发明人 SUBRAMANIAN KANAKASABAPATHI;HUANG XIAOJUN T.;MACDONALD NOEL C.
分类号 H01L21/302;H01L21/308 主分类号 H01L21/302
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