发明名称 Full-wave rectifier for capacitance measurements
摘要 One embodiment of the present invention provides an electronic circuit and method for measuring a capacitance. A signal generating mechanism generates a signal having a predefined frequency and predefined low and high voltage levels on one terminal of the capacitance. The other terminal of the capacitance is coupled to a switching mechanism. The switching mechanism is set to couple the other terminal of the capacitance to a first amplifier or a second amplifier for a portion of each signal cycle thereby full-wave rectifying a transient current flowing between the two terminals in the capacitance. Outputs of the first amplifier and the second amplifier are coupled to a current measurement mechanism for measuring the current. The capacitance is determined from the measured current. Several variations on this embodiment are provided.
申请公布号 US7046017(B1) 申请公布日期 2006.05.16
申请号 US20050216754 申请日期 2005.08.30
申请人 SUN MICROSYSTEMS, INC. 发明人 DROST ROBERT J.;HO RONALD;SUTHERLAND IVAN E.
分类号 G01R27/26;G01N27/22 主分类号 G01R27/26
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