发明名称 |
HALFTONE PHASE SHIFT MASK BLANK, HALFTONE PHASE SHIFT MASK AND THEIR PREPARATION |
摘要 |
In a halftone phase shift mask blank comprising a halftone phase shift film on a substrate which is transparent to exposure light, the halftone phase shift film comprises a metal, silicon, and optionally oxygen and nitrogen. The halftone phase shift film experiences a phase difference change of up to 1 deg. and a transmittance change of up to 0.2% before and after it is exposed to light in a cumulative dose of 1 kJ/cm<SUP>2</SUP>. The halftone phase shift film has excellent resistance to exposure light, specifically high-energy exposure light of short wavelength such as ArF or F<SUB>2 </SUB>laser beam (193 or 157 nm). |
申请公布号 |
KR20060043090(A) |
申请公布日期 |
2006.05.15 |
申请号 |
KR20050014743 |
申请日期 |
2005.02.23 |
申请人 |
SHIN-ETSU CHEMICAL CO., LTD. |
发明人 |
INAZUKI YUKIO;YOSHIKAWA HIROKI;OKAZAKI SATOSHI |
分类号 |
G03C5/00;G03F1/32;G03F1/68;G03F1/80;G03F9/00;H01L21/027 |
主分类号 |
G03C5/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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