发明名称 HALFTONE PHASE SHIFT MASK BLANK, HALFTONE PHASE SHIFT MASK AND THEIR PREPARATION
摘要 In a halftone phase shift mask blank comprising a halftone phase shift film on a substrate which is transparent to exposure light, the halftone phase shift film comprises a metal, silicon, and optionally oxygen and nitrogen. The halftone phase shift film experiences a phase difference change of up to 1 deg. and a transmittance change of up to 0.2% before and after it is exposed to light in a cumulative dose of 1 kJ/cm<SUP>2</SUP>. The halftone phase shift film has excellent resistance to exposure light, specifically high-energy exposure light of short wavelength such as ArF or F<SUB>2 </SUB>laser beam (193 or 157 nm).
申请公布号 KR20060043090(A) 申请公布日期 2006.05.15
申请号 KR20050014743 申请日期 2005.02.23
申请人 SHIN-ETSU CHEMICAL CO., LTD. 发明人 INAZUKI YUKIO;YOSHIKAWA HIROKI;OKAZAKI SATOSHI
分类号 G03C5/00;G03F1/32;G03F1/68;G03F1/80;G03F9/00;H01L21/027 主分类号 G03C5/00
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