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发明名称
RELIABILITY TESTING APPARATUS FOR SAMPLE
摘要
申请公布号
KR20060042493(A)
申请公布日期
2006.05.15
申请号
KR20040091085
申请日期
2004.11.09
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
KIM, KI HYUN;AHN, JUNE HYEON;SEO, HO SEONG;KANG, SEOK MYONG
分类号
G01M7/08
主分类号
G01M7/08
代理机构
代理人
主权项
地址
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