| 摘要 |
<p>The method involves determining a reference point (28) e.g. opening, in an inner area (12) of a thermal processing system based on technically known data. A visual representation of a part of the area is created by an image device detecting electromagnetic waves. The position of the selectable point in the area is determined by comparing the positions of the images of the selectable point and the reference point in the representation. Independent claims are also included for the following: (1) an image device for executing a method for surveying an inner area of a thermal processing system (2) a process control system for operation of a thermal processing system (3) a machine-readable storage medium for storing programs for executing a method for surveying an inner area of a thermal processing system.</p> |
