| 摘要 |
FIELD: electric engineering, in particular, methods for determining potentially unreliable integral circuits. ^ SUBSTANCE: method includes measuring dynamic consumption current before, after effect from electrostatic discharge and after temperature annealing. Effect by 5-10 pulses of electrostatic discharge of both signs lead to extreme allowed voltages in accordance to technical conditions. Temperature annealing is performed under temperature maximally allowed in accordance to technical conditions during 1-8 hours. Integral circuits are screened simultaneously by two criterions: IDst, IDesd>A; |IDann-IDst|>Delta; where IDst, IDesd, IDann - dynamic consumption currents, respectively, starting, after electrostatic discharge and after annealing. Values of dynamic consumption current A and differences of dynamic consumption currents Delta are set on representing selection for each type of circuits. ^ EFFECT: expanded functional capabilities, increased trustworthiness. ^ 1 tbl, 2 dwg |
