发明名称 Multi-value magnetic random access memory with stacked tunnel magnetoresistance (TMR) elements
摘要 A memory cell is constituted by a TMR element and a MOS transistor. The source diffusion layer of the MOS transistor is connected to a source line and the drain diffusion layer of the transistor is connected to a TMR element via a local interconnection wire. The TMR element is held between the local interconnection wire and a bit line. The TMR element is constituted by stacked TMR layers. Each TMR layer is able to have two states, that is, a state in which spin directions are parallel and anti-parallel. Therefore, the TMR element stores four-value data. A current-driving line is set immediately below the TMR element.
申请公布号 US7042753(B2) 申请公布日期 2006.05.09
申请号 US20020073339 申请日期 2002.02.13
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 HORIGUCHI FUMIO
分类号 G11C11/14;G11C11/15;G11C11/16;G11C11/56;H01L21/8246;H01L27/105;H01L43/08 主分类号 G11C11/14
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