发明名称 Methods for measuring strength of film and determining quality of object having the film
摘要 A method for measuring a film strength of a film on an object. An incident angle of pressure waves with respect to an object to be measured, the object including a base coated with a film, is set for applying the pressure waves to the object. The incident angle is varied over a range including a critical angle thetacr. The object generates surface waves, in response to the pressure waves, at and near the critical angle. In response to the surface waves, the object generates leaky waves, which are pressure waves caused by the surface waves. The intensity of pressure waves including reflected waves and leaky waves from the object are measured. A received intensity V<SUB>0 </SUB>at an incident angle where no leaky wave is generated, and the intensity difference V<SUB>C </SUB>between V<SUB>0 </SUB>and the received intensity at the critical angle thetacr when the film strength is high are measured. An intensity difference V<SUB>R </SUB>between V<SUB>0 </SUB>and the received intensity when the intensity of the leaky waves remains unchanged, regardless of the changes in the incident angle, within the range where the leaky waves are generated, which indicates a low film strength, is also measured. Thus, the film strength is determined based on V<SUB>0</SUB>, V<SUB>C</SUB>, and V<SUB>R</SUB>.
申请公布号 US7040170(B2) 申请公布日期 2006.05.09
申请号 US20040891341 申请日期 2004.07.13
申请人 MURATA MANUFACTURING CO., LTD. 发明人 TOKUNAGA YUICHIRO;INAO TAKESHI
分类号 G01N29/00;G01N29/04;G01B17/00;G01N19/04;G01N29/06;G01N29/11;G01N29/27 主分类号 G01N29/00
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