发明名称 Methods for forming semiconductor devices so as to stabilize the same when positioned face-down over test substrates
摘要 One or more of stabilizers are disposed on the surface of a semiconductor device or test substrate that includes bond pads or contact pads located at or proximate to a centerline thereof prior to bonding the semiconductor device face-down upon the test substrate. Upon assembly of the semiconductor device and test substrate, the stabilizers prevent the semiconductor device from tipping or tilting relative to the test substrate. The stabilizers may be preformed structures which are attached to a surface of a semiconductor device, test substrate, or both, or are fabricated on such a surface. Stereolithographic techniques may be used to fabricate the stabilizers. In addition, a machine vision system may be used in conjunction with the stereolithographic technique to recognize the position and orientation of a semiconductor device or test substrate on which the stabilizer is to be fabricated.
申请公布号 US7041513(B2) 申请公布日期 2006.05.09
申请号 US20030430753 申请日期 2003.05.06
申请人 MICRON TECHNOLOGY, INC. 发明人 AKRAM SALMAN
分类号 H01L21/66;G01R31/02;G01R31/26;G01R31/28;H01L21/44;H01L21/60;H01L23/34;H01L23/48;H01L23/58 主分类号 H01L21/66
代理机构 代理人
主权项
地址