发明名称 Method of repairing pit defect and salient defect of electrode pattern
摘要 An inspection process is performed to determine defects of an electrode pattern. A first repairing process is performed to fill the pit part, and a second repairing process is performed to remove the salient part. The first repairing process utilizes a conductive paste to fill the pit part of the electrodes, and the second repairing process utilizes a laser beam to remove the salient part of the electrode pattern so that the electrodes can discharge normally.
申请公布号 US7042547(B2) 申请公布日期 2006.05.09
申请号 US20030707560 申请日期 2003.12.22
申请人 AU OPTRONICS CORP. 发明人 WU YI-JEN
分类号 G02F1/1337;G02F1/133;H05K3/22 主分类号 G02F1/1337
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