Keyhole echo-planar imaging with double (t1 and t2*) contrast (dc-epic)

摘要

The invention relates to a method for examining at least one object during which properties of the object are detected at different times within a spatial frequency space formed by spatial frequencies. According to the invention, the method is carried out in such a manner that temporally consecutive recordings ensue in overlapping regions of the spatial frequency space and additionally in regions of the spatial frequency space that differ from one another.