发明名称 |
Interferometric simultaneous measurement of the topography and refractive index of the surface of an object by measuring the spatial phase distributions from both transmission and reflection interferograms |
摘要 |
<p>Interferometry method for determining the topography and refractive index distribution of the surface of an object (3) has the following steps: simultaneous measurement of a transmission interferogram and reflection interferogram, reconstruction of spatial phase distributions from both the transmission and reflection interferograms and determination of the topography and refractive index distribution for the object from the two phase distributions. An independent claim is made for an interferometer for determining the topography and refractive index distribution of the surface of an object.</p> |
申请公布号 |
DE102004047531(A1) |
申请公布日期 |
2006.05.04 |
申请号 |
DE20041047531 |
申请日期 |
2004.09.30 |
申请人 |
KEMPER, BJOERN;BALLY, GERT VON |
发明人 |
CARL, DANIEL;KEMPER, BYOERN;BALLY, GERT VON |
分类号 |
G01B9/02;G01N21/21 |
主分类号 |
G01B9/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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