TEST PATTERN FOR ABNORMAL PATTERNING DETCTION AND ABNORMAL PATTERNING DETECTING METHOD USING THE SAME,申请号KR20040087713-传众专利搜索

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发明名称	TEST PATTERN FOR ABNORMAL PATTERNING DETCTION AND ABNORMAL PATTERNING DETECTING METHOD USING THE SAME
摘要
申请公布号	KR20060038617(A)	申请公布日期	2006.05.04
申请号	KR20040087713	申请日期	2004.10.30
申请人	HYNIX SEMICONDUCTOR INC.	发明人	JEON, JE HA
分类号	H01L21/66;H01L21/76;H01L23/544	主分类号	H01L21/66
代理机构		代理人
主权项
地址

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